Thin Film Thickness Measurement System
A flexible film thickness measurement system that can combine from spectrometers to software and microscopes.
The film thickness measurement system proposed by OptoSilus is an original system that combines spectrometers, light sources, reflection probes, etc., from Ocean Optics with spectral interference film thickness measurement software from collaborating manufacturers.
- 企業：オプトシリウス
- 価格：Other
